Published on: 10-5-2021
This year’s edition of ‘TNO Semicon Innovation Day’ will be organized as an online event. You are welcome to participate in two sessions during the Dutch Technology Week.
- 10:00 – 12:00 [session A] Ultra clean design and defectivity control
- 15:00 – 17:00 [session B] New inspection and metrology technologies
These webinars will bring together technology leaders from the major Dutch industry players and research institutes to discuss challenges, emerging solutions, and needed innovations for contamination control and semiconductor metrology.
Register for [Session A] Ultra clean design and defectivity control
Register for [Session B] New inspection and metrology technologies